Bluiris FAI-600IV
Application：
Electronic Assembly
Semiconductor
Main advantages
SMT electronic factories have multiple models, small batches and frequent line changes, which make the task of first-piece
testing more and more onerous. The traditional SMT testing method is not only a waste of manpower, low efficiency, the
whole testing process is lack of control, quality is difficult to be guaranteed. To solve this problem, BLUIRIS invents SMT
intelligent first article, it has developed the fourth generation of first detector FAI-600IV
Auto optical inspection and Golden Board
For components with silk screening, the FAI-600IV system checks all components in under a minute. A Golden Boardcan serve as a test reference.
Automatically generate test program
The system automatically identifies clients' BOM and CAD position files and generates a test program for around 3 minutes, with no need to modify clients' data.
Automatically determine the result
The system automatically switches testprofiles, reads values, and compares with BOM. Automatically determine PASS or NG.
