Bluiris FAI-i450-i650

Application：

Electronic Assembly

Semiconductor

SMT electronic factories have multiple models, small batches and frequent line changes, which make the task of first-piece testing more and more onerous. The traditional SMT testing method is not only a waste of manpower, low efficiency, the whole testing process is lack of control, quality is difficult to be guaranteed. To solve this problem, BLUIRIS invents SMT intelligent first article inspection system, it has developed the fourth generation of first detector FAI-i450, which has the following advantages:
Product Consulting

Main advantages

 

Automatically generate test program
The system automatically identifies clients' BOM and CAD position files and generates a test program for around 3 minutes, with no need to modify clients' data.

Automatic flying needle measurement
Multi-motor drive and whole-process optical automatic positioning enable the needle to move quickly and measure the device.

Automatic decision result
The system automatically switches the test gear, automatically reads the value and compares it with the BOM, and automatically confirms and determines PASS or NG.

Screen printing automatic recognition
For chip, diode and screen printing resistance and other devices, the optical system can automatically determine the screen printing, wrong material, reverse and missing paste

Device query retrieval
Support a variety of search methods, such as display and search undetected devices, NG components, angles, specifications, etc.

Reporting function
After the test, the test report is automatically generated, equipped with device image and PCBA related information. Reports can be archived, printed, and emailed.

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