INTEK PLUS iPIS-140
Application：
Electronic Assembly
Semiconductor
The iPIS-140 is a semiconductor package inspection system based on INTEKPLUS’s
innovative vision and component handling technology.
With the high productivity and powerful inspection capability, the iPIS-380 can solve
the request from the real production line.
Main advantages
1) Repeatability is measured on real device and is defined as 3-sigma value of the multiple measurement result.
2) Accuracy is measured on a golden device and is defined as the difference between the certified value of the
golden device and the average value of multiple measurement result.
3) Repeatability and Accuracy value can be different due to the definition, and some item cannot define the
“Accuracy” value due to the certification data cannot guarantee the result.
4) Warpage data use the substrate 3D data difference in the NxN patch substrate 3D data.